描述
数字集成电路的生产测试。生产中使用的测试方法概述。测试方案与可测性设计。故障与故障模型、良率估计、可测性度量、故障仿真、测试生成方法、序列测试、扫描设计、边界扫描、内建自测、CMOS 测试。
原文参考文本
Production testing of digital integrated circuits. Outline of methods of testing used in production. Testing schemes and design for testability. Faults and fault models, yield estimates, testability measures, fault simulation, test generation methods, sequential testing, scan design, boundary scan, built-in self test, CMOS testing.
来源与参考
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来源参考 : https://calendar.carleton.ca/grad/courses/ELEC/