此參考說明所註明的目錄。請向該機構確認當前課程供給與適用於你入學的條件。
課程說明
以X光晶體繞射判定結構 X光在晶體材料上之繞射以判定小分子之結構。主題可包含晶體成長、挑選與安裝、X光生成、晶體對稱與空間群、X光繞射、相位問題、結構求解與精修，以及結構數據之詮釋與呈現。講課，每週3小時。先修科目：CHEM 2P32；三個編號為2(alpha)90或以上之CHEM學分。註：建議修習 CHEM 4P30。可併修。本課程可能以多種授課方式開課。授課方式將列於學期學術時間表。
先修條件
- 先修科目：CHEM 2P32；三個編號為2(alpha)90或以上之CHEM學分。
條件與方式
- 先修科目：CHEM 2P32；三個編號為2(alpha)90或以上之CHEM學分。
- 註：建議修習 CHEM 4P30。可併修。本課程可能以多種授課方式開課。授課方式將列於學期學術時間表。
原文參考文本
Structure Determination by X-ray Crystallography X-ray diffraction by crystalline materials to determine the structures of small molecules. Topics may include crystal growth, selection and mounting, X-ray generation, crystal symmetry and space groups, X-ray diffraction, the phase problem, structure solution and refinement, and interpretation and presentation of structural data. Lectures, 3 hours per week. Prerequisite(s): CHEM 2P32 ; three CHEM credits numbered 2(alpha)90 or above. Note: CHEM 4P30 recommended. May be taken concurrently. This course may be offered in multiple modes of delivery. The method of delivery will be listed on the academic timetable, in the applicable term.
- Prerequisite(s): CHEM 2P32 ; three CHEM credits numbered 2(alpha)90 or above.
- Note: CHEM 4P30 recommended. May be taken concurrently. This course may be offered in multiple modes of delivery. The method of delivery will be listed on the academic timetable, in the applicable term.
來源與參考
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來源參考 : https://brocku.ca/webcal/2024/undergrad/chem.html