Description
Production testing of digital integrated circuits. Outline of methods of testing used in production. Testing schemes and design for testability. Faults and fault models, yield estimates, testability measures, fault simulation, test generation methods, sequential testing, scan design, boundary scan, built-in self test, CMOS testing.
Reference text in its original language
Production testing of digital integrated circuits. Outline of methods of testing used in production. Testing schemes and design for testability. Faults and fault models, yield estimates, testability measures, fault simulation, test generation methods, sequential testing, scan design, boundary scan, built-in self test, CMOS testing.
Sources and references
Dates and sources are retained to help you verify the information. Translations are provided to facilitate reading; the official source governs conditions and requirements.
Source reference : https://calendar.carleton.ca/grad/courses/ELEC/